Scanning Electron Microscope

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Inventory Number: 
dem29
dem29.jpg

The electron microscope provides an entirely new and revealing method for the microscopic examination of the physical features of specimens whose surface topography renders them unsuitable for replication or sectioning for transmission electron microscopy. The SEM 515 is an instrument for any field - biological or materials science, especially for routine tasks. Coupled with the state-of-the-art PGT IMIX-PC EDS system, it has a wide range of capabilities in high quality imaging and EDS analysis of chemical composition.

SEM 515 specifications

Resolution
Accelerating voltage
Electron gun
Magnification
Stage movements

Image media:

Detectors:

5 nm

0.2 to 30 kV
Tungsten
10 to 160,000
Tilt -15° to +60°
Z (one step) 22 mm
Z (fine) 5 mm
X 20 mm
Y 20 mm
Digital storage
Polaroid film
Everhart-Thornley secondary electron detector
Robinson backscattered electron detector

Data
Date: 
c.1970
Location: 
Maker: 

Copyright National Hellenic Research Foundation - National Observatory of Athens